Surface Science Western

Secondary ion mass spectrometry (SIMS) provides elemental and isotopic analysis of very small volumes situated on the surface of solid samples. Operated in dynamic SIMS mode, an energetic primary ion beam sputters ions and neutrals from the sample surface. Some of the sputtered material is ejected either as positive or negative secondary ions. Therefore, each point of the surface becomes a source…

At SSW, we empower academics with high-quality analytical services and affordable access to cutting-edge scientific technology and techniques. Our team of experienced research scientists, who are leaders in their fields with decades of experience and numerous publications, are here to offer expert advice across a wide range of subjects. Whether you’re just starting out or know exactly what equipm…

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© 2024 Western University • All Rights Reserved • Terms of use

© 2024 Western University • All Rights Reserved • Terms of use

Surface Science Western has once again received a 100% satisfaction rating in our annual customer survey. Your feedback continues to drive our commitment to excellence in materials analysis and customer service. A remarkable three-quarters of respondents first connected with SSW through word of mouth or personal experience — whether through colleagues, industry peers, or as former students. This …

© 2024 Western University • All Rights Reserved • Terms of use

© 2024 Western University • All Rights Reserved • Terms of use

Request for analysis: A refractory feed ore sample containing pyrite and arsenopyrite mineral phases was to be analysed for the presence of “invisible” sub-microscopic gold. Objectives: Methodology: Polished sections from specific size fractions of the ore sample were prepared and grains representing both mineral phases were selected and marked for analysis. These mineral particles were analysed …

Request for analysis: Recovery efficiency during the leaching process of an ore sample containing free gold is low. Examine the surface of unleached free gold grains found in the CIL residue tails for the presence of passivating coatings. Objectives: Methodology: Individual free gold grains were selected under the optical stereo microscope from both feed and CIL residue samples and mounted on an …

Request for analysis: Plastic mouldings are attached to painted surfaces of an automobile side panel using a foam adhesive strip. During application at an assembly facility it was noted that intermittent failures of the adhesive were occurring and, as time progressed, full failure of all mouldings were found. Objectives: Methodology: The foam adhesive surfaces, painted side panels exhibiting full…

Basic SEM/EDX spectroscopy screening of the sample composition. Comparative ToF-SIMS surface analysis of feed, con and tail samples to determine statistically significant differences in the surface composition related to potential activators and depressants. Twenty grains per sample will be analyzed.

XRD is an analytical technique used to identify phases in a wide variety of crystalline materials, such as minerals, corrosion products, thin films, bulk materials and polymers. Instrument: The Rigaku SmartLab is a highly automated, multipurpose X-ray diffractometer (XRD). This fully loaded system is a high-resolution XRD equipped with a Cross Beam Optics (CBO) system and a high-precision theta-t…

Request for analysis: A carbonaceous refractory sulphide ore is processed in an autoclave pressure oxidation plant and subsequently subjected to a cyanide leaching. An initial mineralogical study of the feed ore by quantitative dynamic SIMS analysis has shown that 95% of the gold is contained as sub-microscopic gold in pyrite with the remainder contained in primary Fe-oxide minerals. In addition,…

The information provided in this section is intended to outline only features of the techniques related to selected applications in the mineral processing industry. For more detailed information on these techniques and instrumentation, please refer to our main page.

Request for analysis: Multiple crater defects were occurring on painted car panels. Objectives: Methodology: Time of flight secondary ion mass spectroscopy (ToF-SIMS) was used to determine if any contamination was responsible for the crater defects. The instrument used in this work was an ION-TOF (GmbH), ToF-SIMS IV with an upgraded, state-of-the-art, Bismuth Liquid Metal Ion Source (LMIG). This …

Request for analysis: A local manufacturer was experiencing blister defects occurring in foam rubber pieces used in door trim. Objectives: Methodology: The defects were examined in plan view and in cross-section. The cross-sections showed the presence of a white particle in a void. Selected particles were then examined using energy dispersive X-ray (EDX) spectroscopy and Fourier transform infrare…

© 2024 Western University • All Rights Reserved • Terms of use

© 2024 Western University • All Rights Reserved • Terms of use

Deportment of gold in discharge samples from AC-POX/CIL circuits