Tof-SIMS Analysis of Crater Defects - Surface Science Western

Request for analysis: Multiple crater defects were occurring on painted car panels. Objectives: Methodology: Time of flight secondary ion mass spectroscopy (ToF-SIMS) was used to determine if any contamination was responsible for the crater defects. The instrument used in this work was an ION-TOF (GmbH), ToF-SIMS IV with an upgraded, state-of-the-art, Bismuth Liquid Metal Ion Source (LMIG). This technique is extremely surface sensitive and probes the outer 1-3 monolayers of the surface. The...