Template-Derived Masks for 4D-STEM

Abstract Fast pixelated detectors in scanning transmission electron microscopy (STEM) enable acquisition of a two-dimensional diffraction pattern at every probe position, known as four-dimensional STEM (4D-STEM). In 4D-STEM, each measured intensity has dual character, forming a pixel in diffraction space, and equally a pixel in real space. Applying binary masks in diffraction space is often used to produce ‘virtual’ bright-field or annular-dark field images. Here we present a complementary metho