Photovoltaic wafer manufacturing demands near-zero defects, yet anomaly detection models often fail to generalize across manufacturing lines due to domain shift caused by varying imaging devices and process conditions. This letter presents Projection Comparison and Reconstruction (PCR), a framework for cross-domain anomaly detection. Patch-based Domain Fusion mixes source and target images via grid-wise stochastic patch replacement, explicitly increasing cross-domain distribution overlap. Dual-T