Body Diode Induced Negative-Bias V th Instability of Synchronous SiC MOSFET in Bridge-Leg Circuit

This work reports a body diode induced negative-bias V_th instability of synchronous SiC MOSFET in a bridge-leg circuit. During reverse recovery phase, the holes injected from body diode are swept towards the source/gate side. A portion of holes bombard at the gate oxide, which results in the gene