Stralingsgeïnduceerde transiënte effecten in CMOS-circuits

Technology scaling has significantly increased the susceptibility of nanoscale CMOS circuits to radiation-induced transient effects. Reduced node capacitances, lower supply voltages, and stronger device nonlinearity amplify the impact of single-event transients (SETs), particularly in time-dependent circuits such as oscillators. While compact SET models exist at the logic level, they often rely on fixed-shape current sources that neglect voltage dependence and extended charge collection. At the