CComputational Materials Science3/30/2026Research on defect detection performance of silicon carbide wafer surface based on ESN-YOLOv8 algorithmChen Yang·Jingting Sun·Yan He·Xingjun Gao·Meiling Tang·Lin Fan·Siyuan YangRead at Computational Materials ScienceTagsIndustrial Vision Systems and Defect DetectionIndustrial and Manufacturing Engineering
