The diffusion of Sn, Pb, Sb, and Bi tracers in Li metal has been investigated, using a thin-film evaporating-sectioning technique. The results can be expressed by the Arrhenius relations DSn=0.62e\ensuremath−(15.0\ifmmode±\else\textpm\fi1.2)RT{D}_{\mathrm{Sn}}=0.62{e}^{\ensuremath{-}\frac{(15.0\ifmmode\pm\else\textpm\fi{}1.2)}{\mathrm{RT}}}, DPb=1.6\ifmmode×\else\texttimes\fi102e\ensuremath−(25.2\ifmmode±\else\textpm\fi1.2)RT{\mathrm{D}}_{\mathrm{Pb}}=1.6\ifmmode\times\else\texttimes\fi{}{10}^{2}{e}^{\ensuremath{-}\frac{(25.2\ifmmode\pm\else\textpm\fi{}1.2)}{\mathrm{RT}}}, ${D}_{\mathrm{Sb}}=1.6\ifmmode\times\else\texttimes\fi{}{